Art
J-GLOBAL ID：200902134939761509
Reference number：96A0373712
The Influence of the Completeness of the Data Set on the Charge Density Obtained with the Maximum-Entropy Method. A Re-examination of the Electron-Density Distribution in Si.
最大エントロピー法で求めた電荷密度へのデータセットの完全性の影響 Siの電子密度分布の再検討
-
Publisher site
Copy service
{{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=96A0373712©=1") }}
-
Access JDreamⅢ for advanced search and analysis.
{{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=96A0373712&from=J-GLOBAL&jstjournalNo=A0315B") }}
Author (2)：
,
Material：
Volume：
52
Issue：
2
Page：
287-290
Publication year：
Mar. 01, 1996
JST Material Number：
A0315B
ISSN：
0108-7673
CODEN：
ACACEQ
Document type：
Article
Article type：
原著論文
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
JST classification (1)：
JST classification
Category name(code) classified by JST.
X-ray diffraction methods
Terms in the title (6)：
Terms in the title
Keywords automatically extracted from the title.
,
,
,
,
,
Return to Previous Page
