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J-GLOBAL ID:200902135241540752   Reference number:99A0389663

An Algorithm for DC Potential Non-Destructive Testing Using Combination of a Genetic Algorithm and a Gradient Method.

遺伝的アルゴリズムとグラディエント法を組み合わせた直流ポテンシャル法非破壊探傷アルゴリズム
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Material:
Volume: 11  Issue:Page: 15-21  Publication year: Nov. 1998 
JST Material Number: F0789A  ISSN: 0454-1405  CODEN: KTGIA  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Category name(code) classified by JST.
Nondestructive testing  ,  Other methods of operations research 

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