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Art
J-GLOBAL ID:200902135345171716   Reference number:93A0483048

A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films.

Author (5):
Material:
Volume: 67  Page: 407-412  Publication year: Apr. 1993
JST Material Number: B0707B  ISSN: 0169-4332  Document type: Article
Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)

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