Magnetic detection of photogeberated currents in semiconductor wafers using superconducting quantum interference devices.

BEYER J; MATZ H; DRUNG D; SCHURIG T

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J-GLOBAL ID：200902135568008434 Reference number：99A0525641

Magnetic detection of photogeberated currents in semiconductor wafers using superconducting quantum interference devices.

超伝導量子干渉素子を使った半導体ウエハにおける光生成電流の磁気的検出

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Material：
Volume： 74 Issue： 19 Page： 2863-2865 Publication year： May. 10, 1999
JST Material Number： H0613A ISSN： 0003-6951 CODEN： APPLAB Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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Photoconduction,photoelectromotive force , Measurement,testing and reliability of solid-state devices

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