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J-GLOBAL ID：200902136097362310   Reference number：00A0798514

Surface Imaging with Electro-magnetically self-actuating AFM Probe.

電気-磁気的な自己作動性をもつAFMプローブの表面像
Author (3)：
LEE D W

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(Tohoku Univ., Sendai, JPN)

About Tohoku Univ., Sendai, JPN

, 
ONO T

About ONO T

(Tohoku Univ., Sendai, JPN)

About Tohoku Univ., Sendai, JPN

, 
ESASHI M

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(Tohoku Univ., Sendai, JPN)

About Tohoku Univ., Sendai, JPN


Material：
Technical Digest of the Sensor Symposium  (Proceedings of the Sensor Symposium)

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Volume： 17th  Page： 433-436  Publication year： May. 30, 2000 
JST Material Number： X0768A  Document type： Proceedings
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)
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On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
*atomic force microscope

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,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
ナノリソグラフィ

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JST classification (1)：
JST classification
Category name(code) classified by JST.
Microscopy determination of structures 
(BK01040E)

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Terms in the title (4)：
Terms in the title
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磁気

About 磁気

, 
自己

About 自己

, 
AFM

About AFM

, 
プローブ

About プローブ


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