Art
J-GLOBAL ID：200902138070452778   Reference number：01A0873200

BEEM imaging and spectroscopy of buried structures in semiconductors.

半導体の埋め込み構造のバリスティック電子放出顕微鏡画像と分光分析
Author (2)：
NARAYANAMURTI V

About NARAYANAMURTI V

(Harvard Univ., Massachusetts, USA)

About Harvard Univ., Massachusetts, USA

, 
KOZHEVNIKOV M

About KOZHEVNIKOV M

(Harvard Univ., Massachusetts, USA)

About Harvard Univ., Massachusetts, USA


Material：
Physics Reports  (Review Section of Physics Letters (Section C))

About Physics Reports


Volume： 349  Issue： 6  Page： 447-514  Publication year： Aug. 2001 
JST Material Number： A0800A  ISSN： 0370-1573  CODEN： PRPLCM  Document type： Article
Article type： 文献レビュー  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)
Thesaurus term：
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*scanning tunneling microscope

About scanning tunneling microscope

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
ballistic-electron emission microscope

About ballistic-electron emission microscope


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JST classification (3)：
JST classification
Category name(code) classified by JST.
Microscopy determination of structures 
(BK01040E)

About Microscopy determination of structures

,  Electron and ion microscopes 
(BD02050B)

About Electron and ion microscopes

,  Electrical properties of interfaces in general 
(BM03081H)

About Electrical properties of interfaces in general

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
埋め込み

About 埋め込み

, 
バリスティック電子放出顕微鏡

About バリスティック電子放出顕微鏡

, 
分光分析

About 分光分析


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