Art
J-GLOBAL ID:200902139086609002   Reference number:02A0765162

Field emission current from Si tip: Ultra-fast time resolved measurements.

Siチップからの電界放出電流 超高速時間分解測定
Author (4):
Material:
Volume: 515  Issue: 2/3  Page: 369-376  Publication year: Sep. 01, 2002 
JST Material Number: C0129B  ISSN: 0039-6028  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=02A0765162&from=J-GLOBAL&jstjournalNo=C0129B") }}
JST classification (2):
JST classification
Category name(code) classified by JST.
Thermoionic emission and field emission  ,  Study of adsorption by physical means 
Terms in the title (3):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page