Art
J-GLOBAL ID：200902140111322609   Reference number：96A0563603

Scanning tip microwave near-field microscope.

走査型チップのマイクロ波近視野顕微鏡
Author (4)：
WEI T

About WEI T

(Lawrence Berkeley National Lab., California)

About Lawrence Berkeley National Lab., California

, 
XIANG X-D

About XIANG X-D

(Lawrence Berkeley National Lab., California)

About Lawrence Berkeley National Lab., California

, 
WALLACE-FREEDMAN W G

About WALLACE-FREEDMAN W G

(Lawrence Berkeley National Lab., California)

About Lawrence Berkeley National Lab., California

, 
SCHULTZ P G

About SCHULTZ P G

(Lawrence Berkeley National Lab., California)

About Lawrence Berkeley National Lab., California


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 68  Issue： 24  Page： 3506-3508  Publication year： Jun. 10, 1996 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
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scanning probe microscope

About scanning probe microscope

,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
near field(optics)

About near field(optics)


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JST classification (1)：
JST classification
Category name(code) classified by JST.
Electron and ion microscopes 
(BD02050B)

About Electron and ion microscopes

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
走査型

About 走査型

, 
マイクロ波

About マイクロ波

, 
近視野

About 近視野

, 
顕微鏡

About 顕微鏡


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