Art
J-GLOBAL ID:200902140196589650   Reference number:94A0620787

Comprehensive evaluation of ITO thick films produced under optimum annealing conditions.

最適アニーリング条件で作製したITO厚膜の総合評価
Author (4):
Material:
Volume: 33  Issue:Page: 63-71  Publication year: May. 1994 
JST Material Number: D0513C  ISSN: 0927-0248  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=94A0620787&from=J-GLOBAL&jstjournalNo=D0513C") }}
JST classification (1):
JST classification
Category name(code) classified by JST.
Materials of solid-state devices 
Terms in the title (5):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page