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J-GLOBAL ID:200902141574544879   Reference number:00A0543965

Mg and Al K-Edge XAFS Measurements with a KTP Crystal Monochromator.

KTP結晶モノクロメータによるMgおよびAl-K端XAFS測定
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Volume: 1999  Page: 112-113  Publication year: Apr. 2000 
JST Material Number: L2127A  ISSN: 0911-5730  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Other methods of structure determination  ,  Spectroscopy and spectrometers in general 
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