Art
J-GLOBAL ID：200902141578386496   Reference number：01A0552144

Characteristics of low field-emission diamond films by scanning probe microscopy(SPM).

走査型プローブ顕微鏡(SPM)による低電界放出ダイヤモンド膜の特性
Author (4)：
ZHANG L

About ZHANG L

(Toshiba Corp., Kawasaki, JPN)

About Toshiba Corp., Kawasaki, JPN

, 
SAKAI T

About SAKAI T

(Toshiba Corp., Kawasaki, JPN)

About Toshiba Corp., Kawasaki, JPN

, 
SAKUMA N

About SAKUMA N

(Toshiba Corp., Kawasaki, JPN)

About Toshiba Corp., Kawasaki, JPN

, 
ONO T

About ONO T

(Toshiba Corp., Kawasaki, JPN)

About Toshiba Corp., Kawasaki, JPN


Material：
Diamond and Related Materials  (Diam Relat Mater)

About Diamond and Related Materials


Volume： 10  Issue： 3/7  Page： 829-833  Publication year： Mar. 2001 
JST Material Number： W0498A  ISSN： 0925-9635  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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scanning probe microscope

About scanning probe microscope

,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Thermoionic emission and field emission 
(BM09020S)

About Thermoionic emission and field emission

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
走査型プローブ顕微鏡

About 走査型プローブ顕微鏡

, 
SPM

About SPM

, 
電界放出

About 電界放出

, 
ダイヤモンド膜

About ダイヤモンド膜


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