Art
J-GLOBAL ID：200902142206453533   Reference number：99A0395299

Total Reflection X-Ray Fluorescence Using a Compact Synchrotron Radiation Source.

小型放射光源を用いた全反射蛍光X線分析
Author (5)：
SAISHO HIDEO

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(立命館大)

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, 
MATSUDA TOSHIO

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(立命館大 理工)

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, 
IKEDA SHIGERO

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(立命館大)

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, 
YAMADA TAKASHI

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(理学電機 X線研)

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, 
AMANO DAIZO

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(住友重機械工業 量子技研)

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Material：
X線分析の進歩  (X線工業分析)

About X線分析の進歩


Volume： 30  Page： 233-242  Publication year： Mar. 31, 1999 
JST Material Number： Z0547B  ISSN： 0911-7806  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
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*synchrotron radiation

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,...
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JST classification (2)：
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Physical analysis of inorganic compounds 
(CC03024P)

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,  X-ray spectra 
(BH03040J)

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放射光

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, 
全反射蛍光X線分析

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