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J-GLOBAL ID：200902144447236927   Reference number：99A0133411

Analysis of Textile Defects by Scanning Electron Microscope(SEM).

走査電子顕微鏡(SEM)による織物欠点解析事例
Author (2)：
NAKANISHI GENJI

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(石川県工試)

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, 
MATSUMOTO YOSHITAKA

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(石川県工試)

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Material：
石川県工業試験場研究報告  (Report of the Industrial Research Institute of Ishikawa)

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Issue： 47  Page： 83-88  Publication year： Dec. 1998 
JST Material Number： F0740A  ISSN： 0289-8934  CODEN： IKSHE3  Document type： Article
Article type： 解説  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
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*electron microscopy

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,...
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Thesaurus term/Semi thesaurus term
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織物欠点

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,...
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Properties of textile in general 
(YM02010H)

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走査電子顕微鏡

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, 
SEM

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, 
織物

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, 
欠点

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, 
解析

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