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J-GLOBAL ID：200902145618088774   Reference number：97A0250508

High-Resolution Electron Microscopy and Convergent-Beam Electron Diffraction of Sintered Undoped Hydroxyapatite.

ドープなしヒドロキシアパタイト焼結体の高分解能電子顕微鏡と収束電子回折
Author (4)：
KLEEBE H-J

About KLEEBE H-J

(Univ. Bayreuth, Bayreuth, DEU)

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, 
BRES E F

About BRES E F

(Univ. Lille, Villeneuve d’Ascq, FRA)

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, 
BERNACHE-ASSOLANT D

About BERNACHE-ASSOLANT D

(Max-Planck-Inst. Metal Res., Stuttgart, DEU)

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, 
ZIEGLER G

About ZIEGLER G

(Univ. Bayreuth, Bayreuth, DEU)

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Material：
Journal of the American Ceramic Society  (J Am Ceram Soc)

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Volume： 80  Issue： 1  Page： 37-44  Publication year： Jan. 1997 
JST Material Number： C0253A  ISSN： 0002-7820  CODEN： JACTAW  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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high resolution electron microscope

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,...
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Thesaurus term/Semi thesaurus term
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interfacial structure

About interfacial structure


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JST classification (1)：
JST classification
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Properties of ceramics and ceramic whiteware 
(YC03030G)

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Terms in the title (5)：
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ドープ

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, 
ヒドロキシアパタイト

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, 
焼結体

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, 
高分解能電子顕微鏡

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, 
収束電子回折

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