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J-GLOBAL ID：200902145618088774   Reference number：97A0250508

High-Resolution Electron Microscopy and Convergent-Beam Electron Diffraction of Sintered Undoped Hydroxyapatite.

ドープなしヒドロキシアパタイト焼結体の高分解能電子顕微鏡と収束電子回折
Author (4)：
KLEEBE H-J

About KLEEBE H-J

(Univ. Bayreuth, Bayreuth, DEU)

About Univ. Bayreuth, Bayreuth, DEU

, 
BRES E F

About BRES E F

(Univ. Lille, Villeneuve d’Ascq, FRA)

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, 
BERNACHE-ASSOLANT D

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(Max-Planck-Inst. Metal Res., Stuttgart, DEU)

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, 
ZIEGLER G

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(Univ. Bayreuth, Bayreuth, DEU)

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Material：
Journal of the American Ceramic Society  (J Am Ceram Soc)

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Volume： 80  Issue： 1  Page： 37-44  Publication year： Jan. 1997 
JST Material Number： C0253A  ISSN： 0002-7820  CODEN： JACTAW  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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All keywords is available on JDreamIII(charged).
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high resolution electron microscope

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,...
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JST classification (1)：
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Properties of ceramics and ceramic whiteware 
(YC03030G)

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Terms in the title (5)：
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ドープ

About ドープ

, 
ヒドロキシアパタイト

About ヒドロキシアパタイト

, 
焼結体

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, 
高分解能電子顕微鏡

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, 
収束電子回折

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