Art
J-GLOBAL ID：200902150127823042   Reference number：01A0245527

High-resolution observation of the growth motion of elements on surfaces and at interfaces.

表面と界面における元素の成長運動の高分解観測
Author (3)：
YAMANAKA T

About YAMANAKA T

(Univ. Tokyo, Tokyo, JPN)

About Univ. Tokyo, Tokyo, JPN

, 
SHIMOMURA N

About SHIMOMURA N

(Univ. Tokyo, Tokyo, JPN)

About Univ. Tokyo, Tokyo, JPN

, 
INO S

About INO S

(Univ. Tokyo, Tokyo, JPN)

About Univ. Tokyo, Tokyo, JPN


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 77  Issue： 24  Page： 3983-3985  Publication year： Dec. 11, 2000 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
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Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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surface

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,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Semiconductor thin films 
(BK14040E)

About Semiconductor thin films

,  Other phsical analysis 
(CC03014E)

About Other phsical analysis

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
界面

About 界面

, 
元素

About 元素

, 
高分解

About 高分解

, 
観測

About 観測


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