A comparison of the performance of a fundamental parameter method for analysis of total reflection X-ray fluorescence spectra and determination of trace elements, versus an empirical quantification procedure.

WEGRZYNEK D; HOLYNSKA B; OSTACHOWICZ B

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J-GLOBAL ID：200902152013136390 Reference number：98A0552225

A comparison of the performance of a fundamental parameter method for analysis of total reflection X-ray fluorescence spectra and determination of trace elements, versus an empirical quantification procedure.

経験的定量法に対しての,全反射蛍光X線スペクトルの解析及び痕跡元素の定量のための基本パラメータ法の性能の比較

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Volume： 53B Issue： 1 Page： 43-48 Publication year： Jan. 23, 1998
JST Material Number： B0793A ISSN： 0584-8547 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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