Art
J-GLOBAL ID:200902153665880675   Reference number:99A0204046

Advances of Chemical Analysis and Physical Characterization. In-situ X-ray Diffraction Analysis of Electrodeposition of Zinc Layers by Using Synchrotron Radiation.

最先端の化学分析と物理解析 放射光利用X線回折法による亜鉛電析その場構造解析
Author (3):
Material:
Volume: 85  Issue:Page: 180-183  Publication year: Feb. 1999 
JST Material Number: F0332A  ISSN: 0021-1575  CODEN: TEHAA  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=99A0204046&from=J-GLOBAL&jstjournalNo=F0332A") }}
JST classification (3):
JST classification
Category name(code) classified by JST.
Electroplating  ,  X-ray diffraction methods  ,  Crystal structure of metals 
Reference (6):
  • 1) N.Masuko and T.Tsuda : New Trends and Approaches in Electrochemical Technology, Kodansha, Tokyo, (1993), 3.
  • 2) M.G.Samant, M.F.Toney, B.L.Blum and O.R.Melroy : J. Piys. Chem., 92 (1988), 220.
  • 3) Y.Takagi : SR Science and Technology Information, 3 (1993), 3.
  • 4) M.Imafuku, M.Kurosaki and K.Kawasaki : J. Synchrotron Rad., 5 (1998), 935.
  • 5) N.A.Panganov : J Electroanal. Chem., 9 (1965), 70.
more...

Return to Previous Page