Art
J-GLOBAL ID：200902156321436023   Reference number：96A0828805

Temperature-Humidity-Bias-Behavior and Acceleration Model for InP Planar PIN Photodiodes.

InPプレーナPINフォトダイオードの温度-湿度-バイアス依存特性と加速劣化モデル
Author (2)：
OSENBACH J W

About OSENBACH J W

(AT&T Microelectronics, PA, USA)

About AT&T Microelectronics, PA, USA

, 
EVANOSKY T L

About EVANOSKY T L

(AT&T Microelectronics, PA, USA)

About AT&T Microelectronics, PA, USA


Material：
Journal of Lightwave Technology  (J Lightwave Technol)

About Journal of Lightwave Technology


Volume： 14  Issue： 8  Page： 1865-1881  Publication year： Aug. 1996 
JST Material Number： H0922A  ISSN： 0733-8724  CODEN： JLTEDG  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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photodiode

About photodiode

,...
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Thesaurus term/Semi thesaurus term
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accelerated test

About accelerated test

,...
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Photodetectors 
(NC03083X)

About Photodetectors

,  Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (7)：
Terms in the title
Keywords automatically extracted from the title.
InP

About InP

, 
プレーナ

About プレーナ

, 
PINフォトダイオード

About PINフォトダイオード

, 
湿度

About 湿度

, 
バイアス

About バイアス

, 
加速

About 加速

, 
劣化モデル

About 劣化モデル


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