Art
J-GLOBAL ID：200902157524336594
Reference number：97A0080735
Efficient Reliability Test and Lifetime-Prediction.
信頼性試験・寿命予測の効率化
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Author (1)：
Material：
Volume：
96
Issue：
351(R96 19-25)
Page：
1-6
Publication year：
Nov. 08, 1996
JST Material Number：
S0532B
ISSN：
0913-5685
Document type：
Proceedings
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
JAPANESE (JA)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Reliability
, Artificial intelligence
Reference (12)：
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越川. 電子部品の信頼性試験. 1985
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松下電子工業 (株) 編. 半導体デバイスの信頼性技術. 1988
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関西電子工業振興センター信頼性分科会編. 故障をゼロにする信頼性技術. 1990
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植草源三. 機器・部品の寿命と超加速試験法. 1991
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小山. 信頼性技術入門. 1994
ｍore...
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