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J-GLOBAL ID:200902164797826060   Reference number:01A0767287

Comprehensive characterization of hydride VPE grown GaN layers and templates.

水素化物VPE成長させたGaN層及びテンプレートの包括的評価
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Volume: R33  Issue: 5/6  Page: 135-207  Publication year: Jun. 15, 2001 
JST Material Number: T0341A  ISSN: 0927-796X  Document type: Article
Article type: 文献レビュー  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Semiconductor thin films  ,  Lattice defects in semiconductors  ,  Electronic structure of impurites and defects 
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