Atomic Force Microscopy Study of the Silicon Doping Influence on the First Stages of Platinum Electroless Deposition.

GOROSTIZA P; DIAZ R; SERVAT J; SANZ F; MORANTE J R

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J-GLOBAL ID：200902169554936837 Reference number：97A0437052

Atomic Force Microscopy Study of the Silicon Doping Influence on the First Stages of Platinum Electroless Deposition.

白金無電解析出の第1段階に対するシリコンドーピング効果の原子間力顕微鏡研究

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Material：
Volume： 144 Issue： 3 Page： 909-914 Publication year： Mar. 1997
JST Material Number： C0285A ISSN： 1945-7111 CODEN： JESOAN Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Other noncatalytic reactions , Surface structure of semiconductors , Platinum family element complexes

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