The interfaces of poly(p-phenylene vinylene) and fullerene derivatives with Al, LiF, and Al/LiF studied by secondary ion mass spectroscopy and x-ray photoelectron spectroscopy: Formation of AlF<sub>3</sub> disproved.

VAN GENNIP W J H; VAN DUREN J K J; THUENE P C; JANSSEN R A J; NIEMANTSVERDRIET J W

Art

J-GLOBAL ID：200902169830282870 Reference number：02A0734191

The interfaces of poly(p-phenylene vinylene) and fullerene derivatives with Al, LiF, and Al/LiF studied by secondary ion mass spectroscopy and x-ray photoelectron spectroscopy: Formation of AlF₃ disproved.

二次イオン質量分析とX線光電子分光により研究したポリ(p-フェニレンビニレン)及びフラーレン誘導体のAl,LiF及びAl/LiFとの界面 AlF₃の生成を否定

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Author (5)： , , , ,
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Volume： 117 Issue： 10 Page： 5031-5035 Publication year： Sep. 08, 2002
JST Material Number： C0275A ISSN： 0021-9606 CODEN： JCPSA6 Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Physical properties of polymer solids , Atomic and molecular clusters , General

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The interfaces of poly(p-phenylene vinylene) and fullerene derivatives with Al, LiF, and Al/LiF studied by secondary ion mass spectroscopy and x-ray photoelectron spectroscopy: Formation of AlF3 disproved.

The interfaces of poly(p-phenylene vinylene) and fullerene derivatives with Al, LiF, and Al/LiF studied by secondary ion mass spectroscopy and x-ray photoelectron spectroscopy: Formation of AlF₃ disproved.