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J-GLOBAL ID：200902170175274507   Reference number：93A0977030

Measurement of Low-Permittivity Materials Based on a Spectral-Domain Analysis for the Open-ended Coaxial Probe.

開放端同軸プローブのためのスペクトル領域解析に基づく低誘電率材料の測定
Author (4)：
DE LANGHE P

About DE LANGHE P

(Univ. Ghent, Ghent, DEU)

About Univ. Ghent, Ghent, DEU

, 
BLOMME K

About BLOMME K

(Univ. Ghent, Ghent, DEU)

About Univ. Ghent, Ghent, DEU

, 
MARTENS L

About MARTENS L

(Univ. Ghent, Ghent, DEU)

About Univ. Ghent, Ghent, DEU

, 
DE ZUTTER D

About DE ZUTTER D

(Univ. Ghent, Ghent, DEU)

About Univ. Ghent, Ghent, DEU


Material：
IEEE Transactions on Instrumentation and Measurement  (IEEE Trans Instrum Meas)

About IEEE Transactions on Instrumentation and Measurement


Volume： 42  Issue： 5  Page： 879-886  Publication year： Oct. 1993 
JST Material Number： C0232A  ISSN： 0018-9456  CODEN： IEIMAO  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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permittivity

About permittivity

,...
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JST classification (1)：
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Measuring methods and instruments of R,L,C,Q, and dielectric constant 
(AD07030N)

About Measuring methods and instruments of R,L,C,Q, and dielectric constant

Terms in the title (4)：
Terms in the title
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同軸

About 同軸

, 
プローブ

About プローブ

, 
スペクトル領域解析

About スペクトル領域解析

, 
低誘電率材料

About 低誘電率材料


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