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J-GLOBAL ID：200902171705900834   Reference number：96A0520786

Phase change recording using a scanning near-field optical microscope.

近視野走査光学顕微鏡を用いた相変化の記録

Author (9)： HOSAKA S (Hitachi, Ltd., Tokyo, JPN) ,  SHINTANI T (Hitachi, Ltd., Tokyo, JPN) ,  MIYAMOTO M (Hitachi, Ltd., Tokyo, JPN) ,  KIKUKAWA A (Hitachi, Ltd., Tokyo, JPN) ,  HIROTSUNE A (Hitachi, Ltd., Tokyo, JPN) ,  TERAO M (Hitachi, Ltd., Tokyo, JPN) ,  YOSHIDA M (Hitachi Instruments Serv. Co., Ltd., Tokyo, JPN) ,  FUJITA K (Nissei Sangyo Co., Ltd., Tokyo, JPN) ,  KAEMMER S (TopoMetrix Inc., California)
Material： Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)
Volume： 79  Issue： 10  Page： 8082-8086  Publication year： May. 15, 1996 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： scanning optical microscope ,...
Semi thesaurus term： near field(optics) ,...

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JST classification (3)： Other optical effects  (BM08040H) ,  Laser irradiation effects and damages  (BK16040S) ,  Optical instruments and techniques in general  (BD07010S)

Terms in the title (3)： 近視野 ,  走査光学顕微鏡 ,  相変化