Art
J-GLOBAL ID：200902172148562030   Reference number：97A0252495

Dynamically changing interface as a model of measurement in complex systems.

複雑系における測定のモデルとしての動的に変化する界面
Author (2)：
GUNJI Y-P

About GUNJI Y-P

(Kobe Univ., Kobe, JPN)

About Kobe Univ., Kobe, JPN

, 
TOYODA S

About TOYODA S

(Kobe Univ., Kobe, JPN)

About Kobe Univ., Kobe, JPN


Material：
Physica D: Nonlinear Phenomena  (Physica D. Nonlinear Phenomena)

About Physica D: Nonlinear Phenomena


Volume： 101  Issue： 1/2  Page： 27-54  Publication year： Feb. 15, 1997 
JST Material Number： C0749A  ISSN： 0167-2789  CODEN： PDNPDT  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)
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critical phenomenon

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,...
Semi thesaurus term：
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flicker noise

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JST classification (1)：
JST classification
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Fluctuation phenomena,random process,Brownian motion,and transport process 
(BA08020B)

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複雑系

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, 
モデル

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, 
界面

About 界面


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