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J-GLOBAL ID：200902172189876200   Reference number：00A0359018

Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork.

水晶の調整フォークに基いた力センサをもつ非接触原子間力顕微法によるSi(111)-(7×7)上での原子レベルの分解能
Author (1)：
GIESSIBL F J

About GIESSIBL F J

(Univ. Augsburg, Augsburg, DEU)

About Univ. Augsburg, Augsburg, DEU


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 76  Issue： 11  Page： 1470-1472  Publication year： Mar. 13, 2000 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*atomic force microscope

About atomic force microscope

,...
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Thesaurus term/Semi thesaurus term
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force sensor

About force sensor


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JST classification (1)：
JST classification
Category name(code) classified by JST.
Surface structure of semiconductors 
(BK15030A)

About Surface structure of semiconductors

Terms in the title (9)：
Terms in the title
Keywords automatically extracted from the title.
水晶

About 水晶

, 
フォーク

About フォーク

, 
力センサ

About 力センサ

, 
非接触

About 非接触

, 
原子間力

About 原子間力

, 
顕微法

About 顕微法

, 
Si

About Si

, 
原子

About 原子

, 
分解能

About 分解能


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