Near-field optical microscope using a silicon-nitride probe.

VAN HULST N F; MOERS M H P; NOORDMAN O F J; TACK R G; SEGERINK F B; BOELGER B

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J-GLOBAL ID：200902172721599180 Reference number：93A0253754

Near-field optical microscope using a silicon-nitride probe.

窒化けい素プローブを使った近視野顕微鏡

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Author (6)： , , , , ,
Material：
Volume： 62 Issue： 5 Page： 461-463 Publication year： Feb. 01, 1993
JST Material Number： H0613A ISSN： 0003-6951 CODEN： APPLAB Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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Optical instruments and techniques in general

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