Determining Young’s modulus of conductive thin films by a thermal bend beam test.

SHEN W; TANG C Y; LI W; PENG L H

Art

J-GLOBAL ID：200902172769588881 Reference number：01A0540168

Determining Young’s modulus of conductive thin films by a thermal bend beam test.

熱曲げ梁試験を用いた導電性薄膜のYoung率の決定法

Publisher site Copy service {{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=01A0540168&COPY=1") }}
Access JDreamⅢ for advanced search and analysis. {{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=01A0540168&from=J-GLOBAL&jstjournalNo=B0868A") }}

Author (4)： , , ,
Material：
Volume： 36 Issue： 2 Page： 163-168 Publication year： Mar. 2001
JST Material Number： B0868A ISSN： 0309-3247 Document type： Article
Article type：原著論文 Country of issue： United Kingdom (GBR) Language： ENGLISH (EN)

,...

To see more with JDream III (charged). {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=01A0540168&from=J-GLOBAL&jstjournalNo=B0868A") }}

Ceramic materials

, , , ,

Return to Previous Page