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J-GLOBAL ID:200902172769588881   Reference number:01A0540168

Determining Young’s modulus of conductive thin films by a thermal bend beam test.

熱曲げ梁試験を用いた導電性薄膜のYoung率の決定法
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Volume: 36  Issue:Page: 163-168  Publication year: Mar. 2001 
JST Material Number: B0868A  ISSN: 0309-3247  Document type: Article
Article type: 原著論文  Country of issue: United Kingdom (GBR)  Language: ENGLISH (EN)
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Ceramic materials 
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