Optoelectronic distance/displacement measurements and applications. Absolute interferometric distance measurements applying a variable synthetic wavelength.

BECHSTEIN K-H; FUCHS W

Art

J-GLOBAL ID：200902174938960658 Reference number：98A0677303

Optoelectronic distance/displacement measurements and applications. Absolute interferometric distance measurements applying a variable synthetic wavelength.

可変合成波長を応用した干渉法による絶対距離測定

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Material：
Volume： 29 Issue： 3 Page： 179-182 Publication year： Jun. 1998
JST Material Number： D0538B ISSN： 0150-536X Document type： Article
Article type：短報 Country of issue： United Kingdom (GBR) Language： ENGLISH (EN)

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Interferometry and interferometers , Measuring methods and instruments of length,area,cross section,volume,angle

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