Art
J-GLOBAL ID:200902176956924050   Reference number:95A1034360

Formation of Low Reflectance Surface for Electrons and Measurement of Reflection Coefficient.

電子の低反射率面の形成と反射率測定
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Material:
Volume: 115  Issue: 11  Page: 1072-1077  Publication year: Nov. 1995 
JST Material Number: S0808A  ISSN: 0385-4205  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Other laboratory techniques and instrumentation systems in physics 
Reference (7):
  • 小山. 昭53電気学会全大. 1977, 75
  • MASSEY. Electronic and Ionic Impact Phenomena, I. 1969, 112
  • 伊藤. 電学論A. 1990, 110, 363
  • 伊藤. 電学論A. 1984, 104, 17
  • 中村. 静電気学会誌. 1992, 16, 5, 357
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