Art
J-GLOBAL ID：200902177056985769
Reference number：01A0610590
A General Noise and S-Parameter Deembedding Procedure for On-Wafer High-Frequency Noise Measurements of MOSFETs.
MOSFETのオンウエハ高周波雑音測定のための一般的な雑音およびSパラメータ抽出手順
Author (2)：
,
Material：
Volume：
49
Issue：
5
Page：
1004-1005
Publication year：
May. 2001
JST Material Number：
C0229A
ISSN：
0018-9480
CODEN：
IETMAB
Document type：
Article
Article type：
短報
Country of issue：
United States (USA)
Language：
ENGLISH (EN)
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JST classification (3)：
JST classification
Category name(code) classified by JST.
Noise measurement
, Transistors
, Methods and instruments for measuring other electromagnetic quantities
Terms in the title (5)：
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