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J-GLOBAL ID：200902178265668351   Reference number：02A0682980

Characterization and optimization of scan speed for tapping-mode atomic force microscopy.

タッピングモード原子間力顕微法のための走査速度の特性評価と最適化
Author (4)：
SULCHEK T

About SULCHEK T

(Stanford Univ., California)

About Stanford Univ., California

, 
YARALIOGLU G G

About YARALIOGLU G G

(Stanford Univ., California)

About Stanford Univ., California

, 
QUATE C F

About QUATE C F

(Stanford Univ., California)

About Stanford Univ., California

, 
MINNE S C

About MINNE S C

(NanoDevices, California)

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Material：
Review of Scientific Instruments  (Rev Sci Instrum)

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Volume： 73  Issue： 8  Page： 2928-2936  Publication year： Aug. 2002 
JST Material Number： D0517A  ISSN： 0034-6748  CODEN： RSINAK  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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*atomic force microscope

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,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Electron and ion microscopes 
(BD02050B)

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Terms in the title (6)：
Terms in the title
Keywords automatically extracted from the title.
タッピングモード

About タッピングモード

, 
原子間力

About 原子間力

, 
顕微法

About 顕微法

, 
走査速度

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, 
特性評価

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, 
最適化

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