Growth and characterization of epitaxial ferroelectric PbZrxTi1-xO3 thin film capacitors with SrRuO3 electrodes for non-volatile memory applications.

GUERRERO C; ROLDAN J; FERRATER C; GARCIA-CUENCA M V; SANCHEZ F; VARELA M

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J-GLOBAL ID：200902178912540524 Reference number：01A0945275

Growth and characterization of epitaxial ferroelectric PbZr_xTi_1-xO₃ thin film capacitors with SrRuO₃ electrodes for non-volatile memory applications.

不揮発性メモリ応用用SrRuO₃電極を持つエピタキシャル強誘電体PbZr_xTi_1-xO₃薄膜キャパシタの成長と特性化

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Material：
Volume： 45 Issue： 8 Page： 1433-1440 Publication year： Aug. 2001
JST Material Number： H0225A ISSN： 0038-1101 Document type： Article
Article type：原著論文 Country of issue： United Kingdom (GBR) Language： ENGLISH (EN)

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Materials of solid-state devices , Oxide thin films

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