Study on the temperature effects of Al<sub>2</sub>O<sub>3</sub> gate pH-ISFET.

CHOU J-C; WENG C-Y; TSAI H-M

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J-GLOBAL ID：200902180881044030 Reference number：02A0195709

Study on the temperature effects of Al₂O₃ gate pH-ISFET.

Al₂O₃ゲートpH-ISFETの温度効果に関する研究

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Volume： B81 Issue： 2/3 Page： 152-157 Publication year： Jan. 05, 2002
JST Material Number： T0967A ISSN： 0925-4005 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Study on the temperature effects of Al2O3 gate pH-ISFET.

Study on the temperature effects of Al₂O₃ gate pH-ISFET.