Art
J-GLOBAL ID：200902181039455486   Reference number：98A0730026

High-resolution, high-speed, low data age uncertainty, heterodyne displacement measuring interferometer electronics.

高分解能,高速,低いデータエイジ不確定性を持つヘテロダイン変位測定干渉計の電子回路
Author (1)：
DEMAREST F C

About DEMAREST F C

(Zygo Corp., CT, USA)

About Zygo Corp., CT, USA


Material：
Measurement Science and Technology  (Meas Sci Technol)

About Measurement Science and Technology


Volume： 9  Issue： 7  Page： 1024-1030  Publication year： Jul. 1998 
JST Material Number： C0354C  ISSN： 0957-0233  CODEN： MSTCEP  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
high-resolution

About high-resolution

,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=98A0730026&from=J-GLOBAL&jstjournalNo=C0354C") }}
JST classification (2)：
JST classification
Category name(code) classified by JST.
Interferometry and interferometers 
(BD07070G)

About Interferometry and interferometers

,  Other electronic circuits 
(NC05090X)

About Other electronic circuits

Terms in the title (6)：
Terms in the title
Keywords automatically extracted from the title.
高分解能

About 高分解能

, 
不確定性

About 不確定性

, 
ヘテロダイン

About ヘテロダイン

, 
変位測定

About 変位測定

, 
干渉計

About 干渉計

, 
電子回路

About 電子回路


Return to Previous Page

TOP

BOTTOM