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J-GLOBAL ID：200902181682091025
Reference number：96A1011812
Analysis of the Dependence of Ferroelectric Properties of Strontium Bismuth Tantalate (SBT) Thin Films on the Composition and Process Temperature.
タンタル酸ストロンチウムビスマス(SBT)薄膜の強誘電特性の組成及び処理温度への依存性の解析
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Author (3)：
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Material：
Volume：
35
Issue：
9B
Page：
4900-4904
Publication year：
Sep. 1996
JST Material Number：
G0520B
ISSN：
0021-4922
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Ferroelectrics,antiferroelectrics and ferroelasticity
, Oxide thin films
Reference (8)：
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de ARAUJO, C. A. Paz. Nature. 1995, 374, 627
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AMANUMA, K. Appl. Phys. Lett. 1995, 66, 9
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AMANUMA, K. Mater. Res. Soc. Symp. Proc. 1955, 361, 21
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ATSUKI, T. Jpn. J. Appl. Phys. 1995, 34, 5069
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WATANABE, H. Jpn. J. Appl. Phys. 1995, 34, 5240
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