Art
J-GLOBAL ID：200902182108276803   Reference number：98A0708342

The Influence of the M-π-n Structure on CdTe X-Ray Detector Performance.

CdTe結晶X線検出器の性能に与えるM-π-n構造の影響
Author (5)：
IVANOV V I

About IVANOV V I

(Baltic Scientific Instruments, Riga, LTV)

About Baltic Scientific Instruments, Riga, LTV

, 
ALEKSEJAVA L A

About ALEKSEJAVA L A

(Baltic Scientific Instruments, Riga, LTV)

About Baltic Scientific Instruments, Riga, LTV

, 
GAGLIARDI M-A

About GAGLIARDI M-A

(Metorex International Oy, Espoo, FIN)

About Metorex International Oy, Espoo, FIN

, 
GAGLIARDI T

About GAGLIARDI T

(Metorex International Oy, Espoo, FIN)

About Metorex International Oy, Espoo, FIN

, 
NENONEN S

About NENONEN S

(Metorex International Oy, Espoo, FIN)

About Metorex International Oy, Espoo, FIN


Material：
IEEE Transactions on Nuclear Science  (IEEE Trans Nucl Sci)

About IEEE Transactions on Nuclear Science


Volume： 45  Issue： 3, Pt.1  Page： 390-393  Publication year： Jun. 1998 
JST Material Number： C0235A  ISSN： 0018-9499  CODEN： IETNAE  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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Keywords indexed to the article.
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*cadmium telluride

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,...
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Radiation detection and detectors 
(AD08020J)

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Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
CdTe

About CdTe

, 
結晶

About 結晶

, 
X線検出器

About X線検出器


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