Scanning nanoscale multiprobes for conductivity measurements.

BOGGILD P; HANSEN T M; KUHN O; GREY F; JUNNO T; MONTELIUS L

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J-GLOBAL ID：200902182146738519 Reference number：00A0849875

Scanning nanoscale multiprobes for conductivity measurements.

伝導度測定のための走査型ナノスケール-マルチプローブ

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Author (6)： , , , , ,
Material：
Volume： 71 Issue： 7 Page： 2781-2783 Publication year： Jul. 2000
JST Material Number： D0517A ISSN： 0034-6748 CODEN： RSINAK Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Measuring methods and instruments of current,voltage,charge

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