Art
J-GLOBAL ID：200902182512463110   Reference number：00A0516814

A Four-Step Method for De-Embedding Gigahertz On-Wafer CMOS Measurements.

ギガHzウエハ上CMOS分離測定のための4段階法
Author (1)：
KOLDING T E

About KOLDING T E

(Aalborg Univ., Aalborg, DNK)

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Material：
IEEE Transactions on Electron Devices  (IEEE Trans Electron Devices)

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Volume： 47  Issue： 4  Page： 734-740  Publication year： Apr. 2000 
JST Material Number： C0222A  ISSN： 0018-9383  CODEN： IETDAI  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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VLSI

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JST classification (1)：
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Semiconductor integrated circuit 
(NC03162T)

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Terms in the title (3)：
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ウエハ

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, 
CMOS

About CMOS

, 
段階

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