Art
J-GLOBAL ID：200902187026896287   Reference number：95A0047695

X-ray stress analysis of{111}-oriented thin films.

{111}配向膜のX線的応力解析
Author (2)：
HANABUSA TAKAO

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(徳島大 工)

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, 
KUSAKA KAZUYA

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(徳島大 大学院)

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Material：
日本機械学会材料力学部門講演会講演論文集  (日本機械学会M&M材料力学カンファレンス講演論文集)

About 日本機械学会材料力学部門講演会講演論文集


Volume： 1994-B  Page： 316-317  Publication year： Oct. 1994 
JST Material Number： L0191A  Document type： Proceedings
Article type： 短報  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
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X-ray stress measurement

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,...
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Mechanics of elasticity in general 
(HC02010M)

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Terms in the title (3)：
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配向膜

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, 
X線

About X線

, 
応力解析

About 応力解析


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