Art
J-GLOBAL ID：200902187091473440
Reference number：02A0943814
II. Amorphous Silicon. Lifetime-resolved Measurements of Photoluminescence.
II アモルファスシリコン系 フォトルミネッセンスの寿命分解測定
Author (1)：
Material：
Volume：
37
Issue：
12
Page：
923-931
Publication year：
Dec. 15, 2002
JST Material Number：
F0158B
ISSN：
0454-4544
CODEN：
KOTBA2
Document type：
Article
Article type：
解説
Country of issue：
Japan (JPN)
Language：
JAPANESE (JA)
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Luminescence of semiconductors
Terms in the title (4)：
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