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J-GLOBAL ID:200902188124977194   Reference number:99A0205246

Linear Fracture Mechanics Analysis on Growth of Interfacial Delamination in LSI Plastic Packages under Temperature Cyclic Loading.

温度サイクル負荷におけるLSIプラスチックパッケージの層間剥離成長の線形破壊力学による解析
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Material:
Volume: 21  Issue:Page: 422-427  Publication year: Nov. 1998 
JST Material Number: W0590A  ISSN: 1070-9894  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Materials of solid-state devices  ,  Measurement,testing and reliability of solid-state devices 

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