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J-GLOBAL ID:200902188136761073   Reference number:02A0698110

Quinhydrone/Methanol Treatment for the Measurement of Carrier Lifetime in Silicon Substrates.

シリコン基板のキャリア寿命測定に用いるキンヒドロン/メタノール処理
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Volume: 41  Issue: 8A  Page: L870-L872  Publication year: Aug. 01, 2002 
JST Material Number: F0599B  ISSN: 0021-4922  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: ENGLISH (EN)
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Electric conduction in crystalline semiconductors 
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