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J-GLOBAL ID:200902188194942843   Reference number:01A0053520

X-ray induced photoemission of a localized electron and its application to site-selective x-ray absorption fine structure measurement.

局在電子のX線誘起光電子放出とそのサイト選択X線吸収微細構造測定への応用
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Material:
Volume: 88  Issue:Page: 3962-3967  Publication year: Oct. 01, 2000 
JST Material Number: C0266A  ISSN: 0021-8979  CODEN: JAPIAU  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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X-ray spectra in general.Including X-ray  ,  Lattice defects in semiconductors 

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