Improvement of EEPROM cell reliability by optimization of signal programming.

CANET P; BOUCHAKOUR R; HARABECH N; BOIVIN P; MIRABEL J M; PLOSSU C

Art

J-GLOBAL ID：200902190087881356 Reference number：01A0537529

Improvement of EEPROM cell reliability by optimization of signal programming.

信号プログラミングの最適化によるEEPROM素子の信頼性の改善

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Author (6)： , , , , ,
Material：
Volume： 280 Issue： 1/3 Page： 116-121 Publication year： Feb. 2001
JST Material Number： D0642A ISSN： 0022-3093 Document type： Article
Article type：原著論文 Country of issue： Netherlands (NLD) Language： ENGLISH (EN)

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Measurement,testing and reliability of solid-state devices

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