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J-GLOBAL ID:200902190137620680   Reference number:95A0621589

Electron Cyclotron Resonance Microwave Plasma Enhanced SiGe Oxidation and MOS Transistors.

電子サイクロトロン共鳴マイクロ波プラズマ促進SiGe酸化とMOSトランジスタ
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Issue: 141  Page: 711-716  Publication year: 1995 
JST Material Number: E0403B  ISSN: 0305-2346  CODEN: IPHSAC  Document type: Proceedings
Article type: 原著論文  Country of issue: United Kingdom (GBR)  Language: ENGLISH (EN)
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Transistors 

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