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J-GLOBAL ID：200902191159084991   Reference number：00A0596601

Locally enhanced Raman spectroscopy with an atomic force microscope.

原子間力顕微鏡を用いた局所増強Raman分光
Author (1)：
ANDERSON M S

About ANDERSON M S

(California Inst. Technol., California)

About California Inst. Technol., California


Material：
Applied Physics Letters  (Appl Phys Lett)

About Applied Physics Letters


Volume： 76  Issue： 21  Page： 3130-3132  Publication year： May. 22, 2000 
JST Material Number： H0613A  ISSN： 0003-6951  CODEN： APPLAB  Document type： Article
Article type： 短報  Country of issue： United States (USA)  Language： ENGLISH (EN)
Thesaurus term：
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*atomic force microscope

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,...
Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
*surface-stimulated Raman spectroscopy

About surface-stimulated Raman spectroscopy


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JST classification (3)：
JST classification
Category name(code) classified by JST.
Infrared spectroscopy and spectrometers 
(BD07042H)

About Infrared spectroscopy and spectrometers

,  Spectroanalysis 
(CC03012W)

About Spectroanalysis

,  Electron and ion microscopes 
(BD02050B)

About Electron and ion microscopes

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
原子間力顕微鏡

About 原子間力顕微鏡

, 
増強

About 増強

, 
Raman分光

About Raman分光


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