Art
J-GLOBAL ID:200902191350982576   Reference number:01A0554564

Interfatial Reaction of Vapor Deposited Si and Ge Layers and Substrate Atomic Layer.

Si,Ge蒸着層と下地原子層との界面反応
Author (2):
Material:
Volume: 44  Issue:Page: 202-205  Publication year: Mar. 20, 2001 
JST Material Number: G0194A  ISSN: 0559-8516  CODEN: SHINA  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=01A0554564&from=J-GLOBAL&jstjournalNo=G0194A") }}
JST classification (2):
JST classification
Category name(code) classified by JST.
Other noncatalytic reactions  ,  Thin films of other inorganic compounds 
Reference (10):
  • JBRILLSON, L. Surf. Sci. Rep. 1982, 2, 123
  • BORISENKO, Victor E. Semiconducting Silicides. 2000
  • NISHIKAWA, O. J. Vac. Sci. Tchnol. 1983, B1, 4
  • NISHIKAWA, O. J. Vac. Sci. Tchnol. 1983, B1, 4
  • TSONG, T. T. J. Vac. Sci. Tchnol. 1983, B1, 915
more...
Terms in the title (6):
Terms in the title
Keywords automatically extracted from the title.

Return to Previous Page