Structural characterization of nonpolar (112-0) a-plane GaN thin films grown on (11-02) r-plane sapphire.

CRAVEN M D; LIM S H; WU F; SPECK J S; DENBAARS S P

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J-GLOBAL ID：200902193303575183 Reference number：02A0628232

Structural characterization of nonpolar (112-0) a-plane GaN thin films grown on (11-02) r-plane sapphire.

(1-102)r面サファイア基板上に成長した無極性(11-20)a面GaN薄膜の構造の特性化

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Author (5)： , , , ,
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Volume： 81 Issue： 3 Page： 469-471 Publication year： Jul. 15, 2002
JST Material Number： H0613A ISSN： 0003-6951 CODEN： APPLAB Document type： Article
Article type：短報 Country of issue： United States (USA) Language： ENGLISH (EN)

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Semiconductor thin films , Surface structure of semiconductors

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Structural characterization of nonpolar (11<span style=text-decoration:overline>2-</span>0) a-plane GaN thin films grown on (1<span style=text-decoration:overline>1-</span>02) r-plane sapphire.