Art
J-GLOBAL ID：200902193596476540
Reference number：00A0867319
Trap creation in ultrathin SiO2 films due to electron injection studied by scanning tunneling microscopy/scanning tunneling spectroscopy.
走査型トンネル顕微鏡法/走査型トンネル分光法により調べた電子注入によるSiO2超薄膜へのトラップ生成
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Author (3)：
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Material：
Volume：
162/163
Page：
395-400
Publication year：
Aug. 2000
JST Material Number：
B0707B
ISSN：
0169-4332
Document type：
Article
Article type：
原著論文
Country of issue：
Netherlands (NLD)
Language：
ENGLISH (EN)
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JST classification (2)：
JST classification
Category name(code) classified by JST.
Electronic structure of surfaces
, Oxide thin films
Terms in the title (6)：
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